Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography

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dc.contributor.authorMoskovchenko, Alexey
dc.contributor.authorŠvantner, Michal
dc.contributor.authorVavilov, Vladimir P.
dc.contributor.authorChulkov, Arsenii O.
dc.date.accessioned2021-10-25T10:00:26Z
dc.date.available2021-10-25T10:00:26Z
dc.date.issued2021
dc.description.abstractStudie se zabývá kvantitativním stanovením hloubky defektů pomocí flahs pulzní termografie. Nová metoda vyhodnocení navržená v této práci zohledňuje 3D difuzi tepla, konečnou velikost defektů a koeficient tepelné reflexe mezi materiálem a defekty. Metoda je založena na kombinaci známých analytických modelů a procedury nelineárního fittingu (NLF). Algoritmus je ověřen numericky a experimentálně na vzorcích z PLA plastu vyrobených pomocí 3D tisku. Přesnost metody a její efektivcita byla hodnocena porovnáním s referenční metodou založenou rekonstrukci termografického signálu.cs
dc.description.abstract-translatedThis study is focused on the quantitative estimation of defect depth by applying pulsed thermal nondestructive testing. The majority of known defect characterization techniques are based on 1D heat conduction solutions, thus being inappropriate for evaluating defects with low aspect ratios. A novel method for estimating defect depth is proposed by taking into account the phenomenon of 3D heat diffusion, finite lateral size of defects and the thermal reflection coefficient at the boundary between a host material and defects. The method is based on the combination of a known analytical model and a non-linear fitting (NLF) procedure. The algorithm was verified both numerically and experimentally on 3D-printed polylactic acid plastic samples. The accuracy of depth prediction using the proposed method was compared with the reference characterization technique based on thermographic signal reconstruction to demonstrate the efficiency of the proposed NLF methoden
dc.format20 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationMOSKOVCHENKO, A. ŠVANTNER, M. VAVILOV, VP. CHULKOV, AO. Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography. Materials, 2021, roč. 14, č. 8, s. nestránkováno. ISSN: 1996-1944cs
dc.identifier.document-number644543600001
dc.identifier.doi10.3390/ma14081886
dc.identifier.issn1996-1944
dc.identifier.obd43933519
dc.identifier.uri2-s2.0-85104481816
dc.identifier.urihttp://hdl.handle.net/11025/45536
dc.language.isoenen
dc.project.IDEF18_069/0010018/LabIR-PAV / Předaplikační výzkum infračervených technologiícs
dc.publisherMDPIen
dc.relation.ispartofseriesMaterialsen
dc.rights© Creative Commons Attribution 4.0 Internationalen
dc.rights.accessopenAccessen
dc.subjectpulzní termografiecs
dc.subjectkoeficient tepelné reflexecs
dc.subjectpoměr stran defektucs
dc.subjecttepelné NDTcs
dc.subjectcharakteristika defektucs
dc.subjectnelineární fittingcs
dc.subjectrekonstrukce termografického signálucs
dc.subject.translatedpulse thermographyen
dc.subject.translateddefect aspect ratioen
dc.subject.translatedthermal reflection coefficienten
dc.subject.translatedthermal NDTen
dc.subject.translateddefect characterizationen
dc.subject.translatednon-linear fittingen
dc.subject.translatedthermographic signal reconstructionen
dc.titleCharacterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermographyen
dc.title.alternativeStanovení hloubky defektu s nízkým poměrem hodnot velikost/hloubka a nízkou tepelnou odrazivostí pomocí flash pulzní IR termografiecs
dc.typečlánekcs
dc.typearticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

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