Statistics for Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography

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Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography 4

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MOSKOVCHENKO_Depth LAR defects pulsed IRNDT.pdf 20