Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography

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dc.contributor.authorMoskovchenko, Alexey
dc.contributor.authorŠvantner, Michal
dc.contributor.authorVavilov, Vladimir
dc.contributor.authorChulkov, Arsenii
dc.date.accessioned2022-09-12T10:00:26Z
dc.date.available2022-09-12T10:00:26Z
dc.date.issued2022
dc.description.abstract-translatedThis study introduces a novel approach to the presentation of the probability of detection (POD) function in infrared (IR) thermographic nondestructive testing. The modified POD is suggested as a function of two defect parameters, namely, defect depth and lateral size. The proposed approach is based on calculating theoretical values of maximum temperature contrast for many defect size/depth combinations by using an appropriate analytical model. Furthermore, these values are used for the quantification of defects to produce predicted POD curves by applying a signal/response method. The results appear as the POD maps illustrating detectability of defects with various size/depth combinations. By setting a particular POD threshold, for example, 90%, the detectability limit contours can be obtained. These contours illustrate the limiting combinations of the depth and diameter of the defects, which can be detected with a required probability of correct detection under a particular temperature signal threshold. The proposed methodology is illustrated with an example of using the POD approach in pulsed IR thermographic inspection of a 3D printed specimen with artificial sphere-like defects. Such an approach allows predicting the detectability of defects in a vast range of depth/size ratios by using an analytical model and a limited number of experiments.en
dc.format9 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationMOSKOVCHENKO, A. ŠVANTNER, M. VAVILOV, V. CHULKOV, A. Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography. NDT & E INTERNATIONAL, 2022, roč. 130, č. SEP 2022, s. nestránkováno. ISSN: 0963-8695cs
dc.identifier.document-number810428900002
dc.identifier.doi10.1016/j.ndteint.2022.102673
dc.identifier.issn0963-8695
dc.identifier.obd43936540
dc.identifier.uri2-s2.0-85131260947
dc.identifier.urihttp://hdl.handle.net/11025/49651
dc.language.isoenen
dc.project.IDEF18_069/0010018/LabIR-PAV / Předaplikační výzkum infračervených technologiícs
dc.publisherElsevieren
dc.relation.ispartofseriesNdt & E Internationalen
dc.rightsPlný text je přístupný v rámci univerzity přihlášeným uživatelům.cs
dc.rights© Elsevieren
dc.rights.accessrestrictedAccessen
dc.subject.translatedDefect depthen
dc.subject.translatedDetectabilityen
dc.subject.translatedInfrared thermographyen
dc.subject.translatedProbability of detectionen
dc.titleAnalyzing probability of detection as a function of defect size and depth in pulsed IR thermographyen
dc.typečlánekcs
dc.typearticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

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