Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography
Date issued
2022
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Publisher
Elsevier
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Citation
MOSKOVCHENKO, A. ŠVANTNER, M. VAVILOV, V. CHULKOV, A. Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography. NDT & E INTERNATIONAL, 2022, roč. 130, č. SEP 2022, s. nestránkováno. ISSN: 0963-8695