Effects of device imperfections on small punch test

dc.contributor.authorVolák, Josef
dc.contributor.authorBunda, Zbyněk
dc.contributor.authorVarner, Miroslav
dc.contributor.authorKoula, Václav
dc.contributor.authorMach, Josef
dc.contributor.authorŠtěpánek, Martin
dc.contributor.authorMentl, Václav
dc.date.accessioned2019-02-04T11:00:15Z
dc.date.available2019-02-04T11:00:15Z
dc.date.issued2018
dc.description.abstract-translatedDescription of the procedure and results are given for computer simulations of small punch test (SPT) performed on P92 structural steel. The maximum force calculated using the SPT simulation is about 5% higher than the measured value. The punch displacement at the maximum calculated force is 2% less than the measured punch displacement. Effects of several factors were analysed using the SPT simulation, such as friction between the test device and the test specimen, the geometry of the test device, and the clamping force. It was found that SPT results depend strongly on the amount of friction and on imperfections of the test device dimensions and geometry.en
dc.format6 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationVOLÁK, J., BUNDA, Z., VARNER, M., KOULA, V., MACH, J., ŠTĚPÁNEK, M., MENTL, V. Effects of device imperfections on small punsch test. In: Conference Proceedings - METAL 2018 - 27th International Conference on Metallurgy and Materials. Ostrava: TANGER Ltd., Keltickova 62, 710 00 Ostrava, Czech Republic, EU, 2018. s. 646-651. ISBN 978-80-87294-84-0.en
dc.identifier.isbn978-80-87294-84-0
dc.identifier.obd43924018
dc.identifier.uri2-s2.0-85059371637
dc.identifier.urihttp://hdl.handle.net/11025/30904
dc.language.isoenen
dc.project.IDLO1502/RoRTI - Rozvoj Regionálního technologického institutucs
dc.publisherTangeren
dc.relation.ispartofseriesConference Proceedings - METAL 2018 - 27th International Conference on Metallurgy and Materialsen
dc.rightsPlný text je přístupný v rámci univerzity přihlášeným uživatelům.cs
dc.rights© Tangeren
dc.rights.accessrestrictedAccessen
dc.subject.translatedSmall punch testen
dc.subject.translatedimperfectionen
dc.subject.translatedsimulationen
dc.subject.translatedfinite element methoden
dc.titleEffects of device imperfections on small punch testen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

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