Effects of device imperfections on small punch test

Abstract

Description

Subject(s)

Citation

VOLÁK, J., BUNDA, Z., VARNER, M., KOULA, V., MACH, J., ŠTĚPÁNEK, M., MENTL, V. Effects of device imperfections on small punsch test. In: Conference Proceedings - METAL 2018 - 27th International Conference on Metallurgy and Materials. Ostrava: TANGER Ltd., Keltickova 62, 710 00 Ostrava, Czech Republic, EU, 2018. s. 646-651. ISBN 978-80-87294-84-0.