Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy

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dc.contributor.authorLidig, Christian
dc.contributor.authorMinár, Jan
dc.contributor.authorBraun, Jürgen
dc.contributor.authorEbert, Hubert
dc.contributor.authorGloskovskii, Andrei
dc.contributor.authorKrieger, Jonas A.
dc.contributor.authorStrocov, Vladimir N.
dc.contributor.authorKläui, Mathias
dc.contributor.authorJourdan, Martin
dc.date.accessioned2020-08-31T10:00:24Z
dc.date.available2020-08-31T10:00:24Z
dc.date.issued2019
dc.description.abstract-translatedHeusler compounds are promising materials for spintronics with adjustable electronic properties including 100% spin polarization at the Fermi energy. We investigate the electronic states of AlOx capped epitaxial thin films of the ferromagnetic half-metal Co2MnSi ex situ by soft x-ray angular resolved photoemission spectroscopy (SX-ARPES). Good agreement between the experimental SX-ARPES results and photoemission calculations including surface effects was obtained. In particular, we observed in line with our calculations a large photoemission intensity at the center of the Brillouin zone, which does not originate from bulk states, but from a surface resonance. This provides strong evidence for the validity of the previously proposed model based on this resonance, which was applied to explain the huge spin polarization of Co2MnSi observed by angular-integrating UV-photoemission spectroscopy.en
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationLIDIG, C. H., MINÁR, J., BRAUN, J., EBERT, H., GLOSKOVSKII, A., KRIEGER, J. A., STROCOV, V. N., KLÄUI, M., JOURDAN, M. Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy. Physical Review B, 2019, roč. 99, č. 17, s. [1-3]. ISSN 2469-9950.en
dc.identifier.document-number469324500006
dc.identifier.doi10.1103/PhysRevB.99.174432
dc.identifier.issn2469-9950
dc.identifier.obd43929870
dc.identifier.uri2-s2.0-85066397682
dc.identifier.urihttp://hdl.handle.net/11025/39563
dc.language.isoenen
dc.project.IDEF15_003/0000358/Výpočetní a experimentální design pokročilých materiálů s novými funkcionalitamics
dc.publisherAmerican Physical Societyen
dc.relation.ispartofseriesPhysical Review Ben
dc.rights© American Physical Societyen
dc.rights.accessopenAccessen
dc.subject.translatedmagnetic-propertiesen
dc.subject.translatedband-structureen
dc.titleSurface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopyen
dc.typečlánekcs
dc.typearticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

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