Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy
Date issued
2019
Journal Title
Journal ISSN
Volume Title
Publisher
American Physical Society
Abstract
Description
Subject(s)
Citation
LIDIG, C. H., MINÁR, J., BRAUN, J., EBERT, H., GLOSKOVSKII, A., KRIEGER, J. A., STROCOV, V. N., KLÄUI, M., JOURDAN, M. Surface resonance of thin films of the Heusler half-metal Co2MnSi probed by soft x-ray angular resolved photoemission spectroscopy. Physical Review B, 2019, roč. 99, č. 17, s. [1-3]. ISSN 2469-9950.