Investigation and Implementation of Test Vectors for Efficient IC Analysis
| dc.contributor.author | Brutscheck, M. | |
| dc.contributor.author | Franke, M. | |
| dc.contributor.author | Schwarzbacher, Th. | |
| dc.contributor.author | Becker, St. | |
| dc.contributor.editor | Pihera, Josef | |
| dc.contributor.editor | Steiner, František | |
| dc.date.accessioned | 2012-10-08T10:36:23Z | |
| dc.date.available | 2012-10-08T10:36:23Z | |
| dc.date.issued | 2008 | |
| dc.description.abstract-translated | Up until now, the efficient and structured analysis of unknown CMOS integrated circuits (ICs) has become a topic of great relevance. In the last decade different invasive and non-invasive strategies have been developed to analyse unknown ICs. However, invasive procedures always lead to the destruction of the system under investigation. Non-invasive approaches published so far have the disadvantage that ICs are analysed using very complex algorithms. Here, no division is carried out to avoid extensive analysis times in the case that only simple structures are investigated. This paper describes the investigation and implementation of test vectors for efficient IC analysis. To demonstrate the correct operation the non-invasive classification procedure will be used. Furthermore, in this research the properties of several test vectors will be analysed and implemented into analysis environment. All sections of the procedure proposed are simulated and fully tested on ISCAS-85, ISCAS-89 and ISCAS-99 benchmark or user defined models of real ICs and the results are presented in this paper. In every circuit analysed the behaviour has been successfully determined by the use of the proposed test vectors. | en |
| dc.format | 4 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | Electroscope. 2008, Konference EDS 2008. | cs |
| dc.identifier.citation | EDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008. | cs |
| dc.identifier.isbn | 978-80-214-3717-3 | |
| dc.identifier.issn | 1802-4564 | |
| dc.identifier.uri | http://hdl.handle.net/11025/515 | |
| dc.identifier.uri | http://147.228.94.30/images/PDF/Rocnik2008/EDS_2008/brutscheck.pdf | |
| dc.language.iso | en | en |
| dc.publisher | Západočeská univerzita v Plzni, Fakulta elektrotechnická | cs |
| dc.relation.ispartofseries | Electroscope | cs |
| dc.rights | Copyright © 2007-2010 Electroscope. All Rights Reserved. | en |
| dc.rights.access | openAccess | en |
| dc.subject | integrované obvody CMOS | cs |
| dc.subject | analýza integrovaných obvodů | cs |
| dc.subject | testovací vektory | cs |
| dc.subject | neinvazivní klasifikační metody | cs |
| dc.subject.translated | CMOS integrated circuits | en |
| dc.subject.translated | analysis of integrated circuits | en |
| dc.subject.translated | test vectors | en |
| dc.subject.translated | non-invasive classification methods | en |
| dc.title | Investigation and Implementation of Test Vectors for Efficient IC Analysis | en |
| dc.type | konferenční příspěvek | cs |
| dc.type | conferenceObject | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
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