On the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement results

dc.contributor.authorPetryk, Dmytro
dc.contributor.authorDyka, Zoya
dc.contributor.authorKrstic, Milos
dc.contributor.authorBělohoubek, Jan
dc.contributor.authorFišer, Petr
dc.contributor.authorSteiner, František
dc.contributor.authorBlecha, Tomáš
dc.contributor.authorLangendörfer, Peter
dc.contributor.authorKabin, Ievgen
dc.date.accessioned2025-06-20T08:43:49Z
dc.date.available2025-06-20T08:43:49Z
dc.date.issued2023
dc.date.updated2025-06-20T08:43:49Z
dc.description.abstractPhysical side-channel attacks represent a great challenge for today’s chip design. Although attacks on CMOS dynamic power represent a class of state-of-the-art attacks, many other effects potentially affect the security of CMOS chips analogously by affecting mostly static behaviour of the chip, including aging, ionizing radiation, or non-ionizing illumination of the CMOS. Vulnerabilities exploiting data dependency in CMOS static power were already demonstrated in practice and the analogous vulnerability exploiting light-modulated static power was demonstrated by simulation. This work confirms the CMOS vulnerability related to the light-modulated data-dependent static power experimentally and discusses future work.en
dc.format6
dc.identifier.doi10.1109/ICECS58634.2023.10382757
dc.identifier.isbn979-8-3503-2649-9
dc.identifier.obd43941555
dc.identifier.orcidBělohoubek, Jan 0000-0003-4312-9931
dc.identifier.orcidSteiner, František 0000-0002-5702-7015
dc.identifier.orcidBlecha, Tomáš 0000-0001-7257-6242
dc.identifier.urihttp://hdl.handle.net/11025/60791
dc.language.isoen
dc.publisherIEEE
dc.relation.ispartofseries30th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2023)
dc.subjectCMOSen
dc.subjectside-channel attacken
dc.subjectstatic poweren
dc.subjectoptical beam induced current (OBIC)en
dc.subjectdata-dependencyen
dc.titleOn the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement resultsen
dc.typeStať ve sborníku (D)
dc.typeSTAŤ VE SBORNÍKU
dc.type.statusPublished Version
local.files.count1*
local.files.size515269*
local.has.filesyes*
local.identifier.eid2-s2.0-85183579054

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