On the Influence of the Laser Illumination on the Logic Cells Current Consumption : First measurement results
Date issued
2023
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Abstract
Physical side-channel attacks represent a great challenge for today’s chip design. Although attacks on CMOS dynamic power represent a class of state-of-the-art attacks, many other effects potentially affect the security of CMOS chips analogously by affecting mostly static behaviour of the chip, including aging, ionizing radiation, or non-ionizing illumination of the CMOS. Vulnerabilities exploiting data dependency in CMOS static power were already demonstrated in practice and the analogous vulnerability exploiting light-modulated static power was demonstrated by simulation. This work confirms the CMOS vulnerability related to the light-modulated data-dependent static power experimentally and discusses future work.
Description
Subject(s)
CMOS, side-channel attack, static power, optical beam induced current (OBIC), data-dependency