Testing nonlinear analog circuits by supply current variation and supply voltage monitoring

dc.contributor.author	Kuczyński, Andrzej
dc.date.accessioned	2014-07-29T08:26:55Z
dc.date.available	2014-07-29T08:26:55Z
dc.date.issued	2013
dc.description.abstract	In this paper a method for testing nonlinear analog circuits by supply current variation and supply voltage monitoring is presented.	en
dc.format	1 s.	cs
dc.format.mimetype	application/pdf
dc.identifier.citation	CPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering: 4th – 6th September 2013 Roztoky u Křivoklátu, Czech Republic, p. II-9.	en
dc.identifier.isbn	978-80-261-0247-2
dc.identifier.uri	http://hdl.handle.net/11025/11603
dc.language.iso	en	en
dc.publisher	University of West Bohemia	en
dc.relation.ispartofseries	CPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering	en
dc.rights	© University of West Bohemia	en
dc.rights.access	openAccess	en
dc.subject	analogové obvody	cs
dc.subject	detekce chyb	cs
dc.subject	diskrétní vlnková transformace	cs
dc.subject	neuronové sítě	cs
dc.subject.translated	analog circuits	en
dc.subject.translated	fault detection	en
dc.subject.translated	discrete wavelet transform	en
dc.subject.translated	neural networks	en
dc.title	Testing nonlinear analog circuits by supply current variation and supply voltage monitoring	en
dc.type	konferenční příspěvek	cs
dc.type	conferenceObject	en
dc.type.status	Peer-reviewed	en
dc.type.version	publishedVersion	en

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