Structural and Electronic Properties of Ti Doped ZnO: XRD, TEM, EELS and Abinitio Simulations
| dc.contributor.author | Medlín, Rostislav | |
| dc.contributor.author | Minár, Jan | |
| dc.contributor.author | Šutta, Pavol | |
| dc.contributor.author | Khan, Wilayat | |
| dc.contributor.author | Šipr, Ondřej | |
| dc.contributor.author | Novák, Petr | |
| dc.contributor.author | Netrvalová, Marie | |
| dc.date.accessioned | 2021-12-06T11:00:25Z | |
| dc.date.available | 2021-12-06T11:00:25Z | |
| dc.date.issued | 2017 | |
| dc.description.abstract-translated | ZnO is a wide used ferroelectric material with a variety of applications. When ZnO is doped by the appropriate transition metal elements, physical properties of the material can be significantly modified [1,2]. Here we present a comprehensive study based on a combination of XRD, optical properties, HRTEM and EELS to investigate the structural and electronic properties of Ti-doped ZnO. | en |
| dc.format | 2 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | MEDLÍN, R. MINÁR, J. ŠUTTA, P. KHAN, W. ŠIPR, O. NOVÁK, P. NETRVALOVÁ, M. Structural and Electronic Properties of Ti Doped ZnO: XRD, TEM, EELS and Abinitio Simulations. MICROSCOPY AND MICROANALYSIS, 2017, roč. 23, č. Suppl. 1, s. 1686-1687. ISSN: 1431-9276 | cs |
| dc.identifier.doi | 10.1017/S1431927617009096 | |
| dc.identifier.issn | 1431-9276 | |
| dc.identifier.obd | 43933742 | |
| dc.identifier.uri | http://hdl.handle.net/11025/46275 | |
| dc.language.iso | en | en |
| dc.project.ID | EF15_003/0000358/Výpočetní a experimentální design pokročilých materiálů s novými funkcionalitami | cs |
| dc.publisher | Microscopy Society of America | en |
| dc.relation.ispartofseries | Microscopy And Microanalysis | en |
| dc.rights | © Microscopy Society of America | en |
| dc.rights.access | openAccess | en |
| dc.subject.translated | ZnO | en |
| dc.subject.translated | ZnO:Ti | en |
| dc.subject.translated | TEM | en |
| dc.subject.translated | XRD | en |
| dc.subject.translated | EELS | en |
| dc.subject.translated | Abinitio simulations | en |
| dc.title | Structural and Electronic Properties of Ti Doped ZnO: XRD, TEM, EELS and Abinitio Simulations | en |
| dc.type | článek | cs |
| dc.type | article | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |