Using VHDL-AMS to simulate aging behavior of electronic components
| dc.contributor.author | Hofmann, Gerhard | |
| dc.contributor.author | Georgiev, Vjačeslav | |
| dc.contributor.editor | Pinker, Jiří | |
| dc.date.accessioned | 2019-10-08T08:25:22Z | |
| dc.date.available | 2019-10-08T08:25:22Z | |
| dc.date.issued | 2016 | |
| dc.description.abstract-translated | Reliability of electronics is in the automotive industry very important. The average age of cars in Germany was 9 years at 2015.i Normally the life time is evaluated by the environmental test according ISO 16750. The content of this paper is to contribute that computer simulation of aging is a possible way to evaluate electronic circuits in the define phase. For this reason a VHDL-AMS simulation models is used to model aging behavior of a resistor. | en |
| dc.format | 4 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | 2016 International Conference on Applied Electronics: Pilsen, 6th – 7th September 2016, Czech Republic, p.89-92. | en |
| dc.identifier.isbn | 978–80–261–0601–2 (Print) | |
| dc.identifier.isbn | 978–80–261–0602–9 (Online) | |
| dc.identifier.issn | 1803–7232 (Print) | |
| dc.identifier.issn | 1805–9597 (Online) | |
| dc.identifier.uri | http://hdl.handle.net/11025/35195 | |
| dc.language.iso | en | en |
| dc.publisher | Západočeská univerzita v Plzni | cs |
| dc.rights | © Západočeská univerzita v Plzni | cs |
| dc.rights.access | openAccess | en |
| dc.subject | stárnutí | cs |
| dc.subject | rezistor | cs |
| dc.subject | modelování integrovaných obvodů | cs |
| dc.subject | matematický model | cs |
| dc.subject | výpočetní modelování | cs |
| dc.subject | knihovny | cs |
| dc.subject.translated | aging | en |
| dc.subject.translated | resistors | en |
| dc.subject.translated | integrated circuit modeling | en |
| dc.subject.translated | mathematical model | en |
| dc.subject.translated | SPICE | en |
| dc.subject.translated | computational modeling | en |
| dc.subject.translated | libraries | en |
| dc.title | Using VHDL-AMS to simulate aging behavior of electronic components | en |
| dc.type | konferenční příspěvek | cs |
| dc.type | conferenceObject | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
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