A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors
| dc.contributor.author | Broulím, Jan | |
| dc.contributor.author | Broulím, Pavel | |
| dc.contributor.author | Campbell, Michael | |
| dc.contributor.author | Georgiev, Vjačeslav | |
| dc.contributor.author | Holík, Michael | |
| dc.contributor.author | Kunstmüller, Petr | |
| dc.contributor.author | Pavlíček, Vladimír | |
| dc.contributor.author | Pospíšil, Stanislav | |
| dc.contributor.author | Vavroch, Ondřej | |
| dc.contributor.author | Vlášek, Jakub | |
| dc.contributor.author | Zich, Jan | |
| dc.date.accessioned | 2021-01-18T11:00:17Z | |
| dc.date.available | 2021-01-18T11:00:17Z | |
| dc.date.issued | 2020 | |
| dc.description.abstract-translated | Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs temporally and spatially correlated with Timepix3 detectors. The Timepix detector is a semiconductor pixel detector, which contains 256 x 256 pixels. It provides energy or time information for each hit pixel. Our experimental setup consists of FPGA based board synchronized Timepix readout and a Device Under Test (DUT). | en |
| dc.format | 4 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | BROULÍM, J., BROULÍM, P., CAMPBELL, M., GEORGIEV, V., HOLÍK, M., KUNSTMÜLLER, P., PAVLÍČEK, V., POSPÍŠIL, S., VAVROCH, O., VLÁŠEK, J., ZICH, J. A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors. Nuclear instruments & Methods in physics research section a-accelerators spectrometers detectors and associated equipment, 2020, roč. 980, č. November 2020, s. 1-4. ISSN 0168-9002. | cs |
| dc.identifier.document-number | 576959300004 | |
| dc.identifier.doi | 10.1016/j.nima.2020.164397 | |
| dc.identifier.issn | 0168-9002 | |
| dc.identifier.obd | 43930097 | |
| dc.identifier.uri | 2-s2.0-85089278130 | |
| dc.identifier.uri | http://hdl.handle.net/11025/42457 | |
| dc.language.iso | en | en |
| dc.project.ID | EF16_019/0000766/Inženýrské aplikace fyziky mikrosvěta | cs |
| dc.project.ID | LTT17018/Získávání nových poznatků o mikrosvětě v infrastruktuře CERN | cs |
| dc.project.ID | SGS-2018-001/Výzkum a vývoj elektronických a komunikačních systémů ve vědeckých a inženýrských aplikacích | cs |
| dc.publisher | Elsevier | en |
| dc.relation.ispartofseries | Nuclear Instruments & Methods In Physics Research Section A-accelerators Spectrometers Detectors And Associated Equipment | en |
| dc.rights | Plný text je přístupný v rámci univerzity přihlášeným uživatelům. | cs |
| dc.rights | © Elsevier | en |
| dc.rights.access | restrictedAccess | en |
| dc.subject.translated | timepix | en |
| dc.subject.translated | uProbe | en |
| dc.subject.translated | single event effects | en |
| dc.subject.translated | device under test | en |
| dc.title | A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors | en |
| dc.type | článek | cs |
| dc.type | article | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |