Verification of the current load capacity of the MOSFET transistor for low-voltage application using temperature estimation
Date issued
2019
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Abstract
Description
Subject(s)
Citation
ŠTĚPÁNEK, J., BEDNÁŘ, B., DRÁBEK, P. Verification of the current load capacity of the MOSFET transistor for low-voltage application using temperature estimation. In: Proceedings of the IEEE International Symposium on Industrial Electronics (ISIE 2019). Piscataway: IEEE, 2019. s. 1014-1019. ISBN 978-1-72813-666-0 , ISSN 2163-5137.