Analyzing core level photoelectrons by diffraction and circular dichroism via means of first-principle scattering calculations

dc.contributor.authorVo, Phuc
dc.contributor.authorTkach, Olena
dc.contributor.authorTricot, Sylvain
dc.contributor.authorSébilleau, Didier
dc.contributor.authorWinkelmann, Aimo
dc.contributor.authorFedchenko, Olena
dc.contributor.authorLytvynenko, Yaryna
dc.contributor.authorVasilyev, Dmitry
dc.contributor.authorElmers, Hans-Joachim
dc.contributor.authorSchönhense, Gerd
dc.contributor.authorMinár, Jan
dc.date.accessioned2025-06-27T10:10:01Z
dc.date.available2025-06-27T10:10:01Z
dc.date.issued2024
dc.date.updated2025-06-27T10:10:01Z
dc.description.abstractPhotoelectron diffraction (PED) of core-level photoemission is an influential spectroscopic technique that provides valuable insights into the electronic and geometrical structure of materials at the atomic scale. In fact, it is not only a powerful method but also an unexpected effect. The choice of an appropriate theoretical formalism to interpret the experiments is therefore a necessity. Building on our previous successful work on the implementation of PED under the SPRKKR package, this study presents new and detailed experimental-theoretical comparisons of other core levels, providing deeper insights into material properties. We have calculated the circular dichroism in angular distributions (CDAD) for 3p, 3d and 4p of W(110) for application-specific purposes. The discriminant diffractogram between split core-levels is discussed. Above 50% difference in the spin-orbit doublets of 3d and 4p is reported. Hard X-rays (6000 eV) with right and left circularly polarized radiation (RCP and LCP, respectively) are used to generate photoelectrons. Through a comprehensive comparison of measured and calculated results, this study advances our understanding of PED simulations and their implications for materials characterization and discoveryen
dc.format7
dc.identifier.doi10.1063/5.0234142
dc.identifier.isbn978-0-7354-5060-8
dc.identifier.issn0094-243X
dc.identifier.obd43945805
dc.identifier.orcidVo, Phuc 0000-0002-8274-207X
dc.identifier.orcidMinár, Jan 0000-0001-9735-8479
dc.identifier.urihttp://hdl.handle.net/11025/61919
dc.language.isoen
dc.project.IDEH22_008/0004572
dc.publisherAIP Publishing
dc.relation.ispartofseries29th International Conference on Applied Physics of Condensed Matter, APCOM 2024
dc.subjectanalyzingen
dc.subjectcoreen
dc.subjectlevelen
dc.subjectphotoelectronsen
dc.subjectdiffractionen
dc.subjectdichroismen
dc.subjectfirst-principleen
dc.subjectscatteringen
dc.subjectcalculationsen
dc.titleAnalyzing core level photoelectrons by diffraction and circular dichroism via means of first-principle scattering calculationsen
dc.typeStať ve sborníku (D)
dc.typeSTAŤ VE SBORNÍKU
dc.type.statusPublished Version
local.files.count1*
local.files.size1236007*
local.has.filesyes*
local.identifier.eid2-s2.0-85208414337

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