BS-Patch: Constrained Bezier Parametric Patch

dc.contributor.authorSkala, Václav
dc.date.accessioned2014-06-10T11:19:06Z
dc.date.available2014-06-10T11:19:06Z
dc.date.issued2013
dc.description.abstractBezier parametric patches are used in engineering practice quite often, especially in CAD/CAM systems oriented to mechanical design. In many cases quadrilateral meshes are used for tessellation of parameters domain. We propose a new modification of the Bezier cubic rectangular patch, the BS-patch, which is based on the requirement that diagonal curves must be of degree 3 instead of degree 6 as it is in the case of the Bezier patch. Theoretical derivation of conditions is presented and some experimental results as well. he BS-Patch is convenient for applications where for different tessellation of the u - υ domain different degrees of diagonal curves are not acceptable.en
dc.format10 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationWSEAS Transactions on Mathematics. 2013, vol. 12, no. 5, p. 598-607.en
dc.identifier.issn2224-2880
dc.identifier.urihttp://hdl.handle.net/11025/11329
dc.language.isoenen
dc.publisherWSEAScs
dc.relation.ispartofseriesWSEAS Transaction on Mathematicsen
dc.rightsOriginal article published under copyright licence: © 2013 WSEASen
dc.rights.accessopenAccessen
dc.subjectgeometrické modelovánícs
dc.subjectparametrické modelovánícs
dc.subjectBéziérovy plochycs
dc.subject.translatedgeometric modellingen
dc.subject.translatedparametric modellingen
dc.subject.translatedBézier surfacesen
dc.titleBS-Patch: Constrained Bezier Parametric Patchcs
dc.typečlánekcs
dc.typearticleen
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

Files

Original bundle
Showing 1 - 1 out of 1 results
No Thumbnail Available
Name:
Skala_2013_BS-Patch-final.pdf
Size:
973.07 KB
Format:
Adobe Portable Document Format
Description:
Plný text
License bundle
Showing 1 - 1 out of 1 results
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description:

Collections