Comparison of Waffle and standard gate pattern base on specific on-resistance
Date issued
2014
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Západočeská univerzita v Plzni, Fakulta elektrotechnická
Abstract
Description
Subject(s)
struktury MOS, tranzistory MOS
Citation
Electroscope. 2014, č. 3, EDS 2014.