Microscale comparison of solar cell recombination centers
| dc.contributor.author | Škarvada, Pavel | |
| dc.contributor.author | Tománek, Pavel | |
| dc.contributor.author | Koktavý, Pavel | |
| dc.contributor.editor | Pihera, Josef | |
| dc.contributor.editor | Steiner, František | |
| dc.date.accessioned | 2012-11-09T11:52:37Z | |
| dc.date.available | 2012-11-09T11:52:37Z | |
| dc.date.issued | 2011 | |
| dc.description.abstract-translated | The aim of this work is an experimental microscale comparison of several imperfection types of silicon solar cells which emit visible light under reverse bias condition. The setup with scanning probe microscope (SPM) and sensitive detector is used for the measurement of light emission in microscale. Used SPM allows a measurement of Light Beam Induced Current (LBIC) with high spatial resolution together with sample topography. Due to a number of observed defects that have no correlation with surface topography, we have found out that there are also defects having strong correlation with surface topography. In the most cases, investigated inhomogeneites could not be localized via light induced beam technique. | en |
| dc.format | 4 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | Electroscope. 2011, č. 4, EDS 2011. | cs |
| dc.identifier.issn | 1802-4564 | |
| dc.identifier.uri | http://147.228.94.30/images/PDF/Rocnik2011/Cislo4_2011/r5c4c6.pdf | |
| dc.identifier.uri | http://hdl.handle.net/11025/625 | |
| dc.language.iso | en | en |
| dc.publisher | Západočeská univerzita v Plzni, Fakulta elektrotechnická | cs |
| dc.relation.ispartofseries | Electroscope | cs |
| dc.rights | Copyright © 2007-2010 Electroscope. All Rights Reserved. | en |
| dc.rights.access | openAccess | en |
| dc.subject | solární články | cs |
| dc.subject | silikon | cs |
| dc.subject | defekty | cs |
| dc.subject | rastrovací sondová mikroskopie | cs |
| dc.subject.translated | sollar cells | en |
| dc.subject.translated | silicon | en |
| dc.subject.translated | defects | en |
| dc.subject.translated | scanning probe microscope | en |
| dc.title | Microscale comparison of solar cell recombination centers | en |
| dc.type | konferenční příspěvek | cs |
| dc.type | conferenceObject | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
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