Optimization of the reliability ensuring of radioelectronic equipment

dc.contributor.authorNedostup, Leonid
dc.contributor.authorKiselychnyk, Myroslav
dc.contributor.authorZayarnyuk, Pavlo
dc.date.accessioned2017-03-30T05:57:16Z
dc.date.available2017-03-30T05:57:16Z
dc.date.issued2015
dc.description.abstract-translatedIn this paper presents proposals for the REE reliability ensure methods supplement, which allows to optimize the manufacturing process, to calculate the impact of defects, to predicting parametrical reliability. This will improve overall reliability and reduce the cost of its maintenance.en
dc.format1 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationCPEE – AMTEE 2015: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineering: 6th – 8th September 2015 Třebíč, Czech Republic, p. III-3.en
dc.identifier.isbn978-80-261-0527-5
dc.identifier.urihttp://hdl.handle.net/11025/25740
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plznics
dc.relation.ispartofseriesCPEE – AMTEE 2013: Joint conference Computational Problems of Electrical Engineering and Advanced Methods of the Theory of Electrical Engineeringen
dc.rights© University of West Bohemiaen
dc.rights.accessopenAccessen
dc.subjectspolehlivostcs
dc.subjectoptimalizace výrobycs
dc.subjectzávadycs
dc.subjectparametrická spolehlivostcs
dc.subject.translatedreliabilityen
dc.subject.translatedoptimization of manufacturingen
dc.subject.translateddefectivenessen
dc.subject.translatedparametrical reliabilityen
dc.titleOptimization of the reliability ensuring of radioelectronic equipmenten
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

Files

Original bundle
Showing 1 - 1 out of 1 results
No Thumbnail Available
Name:
Nedostup.pdf
Size:
166.63 KB
Format:
Adobe Portable Document Format
Description:
Plný text
License bundle
Showing 1 - 1 out of 1 results
No Thumbnail Available
Name:
license.txt
Size:
1.71 KB
Format:
Item-specific license agreed upon to submission
Description: