Noise spectroscopy of shallow traps in CdTe crystals
| dc.contributor.author | Schauer, Pavel | |
| dc.contributor.editor | Pihera, Josef | |
| dc.contributor.editor | Steiner, František | |
| dc.date.accessioned | 2012-11-01T09:59:58Z | |
| dc.date.available | 2012-11-01T09:59:58Z | |
| dc.date.issued | 2010 | |
| dc.description.abstract-translated | We introduce the noise traps spectroscopy, which is a method of material characterization. This method makes it possible to localize the shallow traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light. All traps energies can be found in papers of other authors. | en |
| dc.format | 5 s. | cs |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | Electroscope. 2010, č. 3, EDS 2010. | cs |
| dc.identifier.issn | 1802-4564 | |
| dc.identifier.uri | http://hdl.handle.net/11025/586 | |
| dc.language.iso | en | en |
| dc.publisher | Západočeská univerzita v Plzni, Fakulta elektrotechnická | cs |
| dc.relation.ispartofseries | Electroscope | cs |
| dc.rights | Copyright © 2007-2010 Electroscope. All Rights Reserved. | en |
| dc.rights.access | openAccess | en |
| dc.subject | noise spectroscopy | cs |
| dc.subject | shallow traps | cs |
| dc.subject | CdTe crystals | cs |
| dc.subject.translated | zvuková spektroskopie | en |
| dc.subject.translated | mělké pasti | en |
| dc.subject.translated | krytaly CdTe | en |
| dc.title | Noise spectroscopy of shallow traps in CdTe crystals | en |
| dc.type | konferenční příspěvek | cs |
| dc.type | conferenceObject | en |
| dc.type.status | Peer-reviewed | en |
| dc.type.version | publishedVersion | en |
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