Noise spectroscopy of shallow traps in CdTe crystals

dc.contributor.authorSchauer, Pavel
dc.contributor.editorPihera, Josef
dc.contributor.editorSteiner, František
dc.date.accessioned2012-11-01T09:59:58Z
dc.date.available2012-11-01T09:59:58Z
dc.date.issued2010
dc.description.abstract-translatedWe introduce the noise traps spectroscopy, which is a method of material characterization. This method makes it possible to localize the shallow traps and find out their parameters. It is based on the measurement of the current noise spectral density versus temperature plots for different energies of the sample illuminating monochromatic light. All traps energies can be found in papers of other authors.en
dc.format5 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationElectroscope. 2010, č. 3, EDS 2010.cs
dc.identifier.issn1802-4564
dc.identifier.urihttp://147.228.94.30/images/PDF/Rocnik2010/Cislo3_2010_EDS/r4c3c13.pdf
dc.identifier.urihttp://hdl.handle.net/11025/586
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plzni, Fakulta elektrotechnickács
dc.relation.ispartofseriesElectroscopecs
dc.rightsCopyright © 2007-2010 Electroscope. All Rights Reserved.en
dc.rights.accessopenAccessen
dc.subjectnoise spectroscopycs
dc.subjectshallow trapscs
dc.subjectCdTe crystalscs
dc.subject.translatedzvuková spektroskopieen
dc.subject.translatedmělké pastien
dc.subject.translatedkrytaly CdTeen
dc.titleNoise spectroscopy of shallow traps in CdTe crystalsen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

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