Scintillation breakdowns in tantalum capacitors

dc.contributor.authorTeverovsky, Alexander
dc.contributor.editorPihera, Josef
dc.contributor.editorSteiner, František
dc.date.accessioned2012-10-08T12:40:40Z
dc.date.available2012-10-08T12:40:40Z
dc.date.issued2008
dc.description.abstract-translatedScintillations in tantalum capacitors are momentarily local breakdowns terminated by a self-healing, or conversion of the manganese oxide used as a cathode to a high-resistive mode. Similar breakdown events are often considered as nuisances, rather than failures. The author argues that a time-dependent sustained scintillation breakdown can be considered as a major reason of failures during steady-state operation of the capacitors. Analysis of distributions of scintillation breakdown voltages and assessment of the safety margins are critical to assure high quality and reliability of tantalum capacitors.en
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationElectroscope. 2008, Konference EDS 2008.cs
dc.identifier.citationEDS '08 IMAPS CS International Conference Proceedings. Brno, VUT v Brně, 2008.cs
dc.identifier.isbn978-80-214-3717-3
dc.identifier.issn1802-4564
dc.identifier.urihttp://hdl.handle.net/11025/522
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plzni, Fakulta elektrotechnickács
dc.relation.ispartofseriesElectroscopecs
dc.rightsCopyright © 2007-2010 Electroscope. All Rights Reserved.en
dc.rights.accessopenAccessen
dc.subjectscintilacecs
dc.subjecttantalové kapacitorycs
dc.subject.translatedscintillationen
dc.subject.translatedtantalum capacitorsen
dc.titleScintillation breakdowns in tantalum capacitorsen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

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