Study of Dielectric Strength of Ceramic Substrates for Power Electronics

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dc.contributor.authorKupilík, Tomáš
dc.contributor.authorKvasnička, Petr
dc.contributor.authorHlína, Jiří
dc.contributor.authorPihera, Josef
dc.contributor.authorProsr, Pavel
dc.contributor.authorŘeboun, Jan
dc.date.accessioned2026-03-20T19:05:41Z
dc.date.available2026-03-20T19:05:41Z
dc.date.issued2025
dc.date.updated2026-03-20T19:05:41Z
dc.description.abstractThis paper is focused on a detailed study of dielectric strength and surface and inner morphology of ceramic substrates for power electronics applications. Dielectric strength is a key parameter in this field. It depends on the type of ceramic material and substrate thickness. The presented study includes five types of ceramic substrate material and five different thicknesses of substrate. The results of dielectric strength measurement depend on ceramic material and substrate thickness and related to morphology are described in this paper.en
dc.format5
dc.identifier.document-number001585293500046
dc.identifier.doi10.1109/ISSE65583.2025.11120980
dc.identifier.isbn979-8-3315-1216-3
dc.identifier.issn2161-2528
dc.identifier.obd43946930
dc.identifier.orcidKupilík, Tomáš 0009-0004-2860-3927
dc.identifier.orcidKvasnička, Petr 0009-0009-6308-9800
dc.identifier.orcidHlína, Jiří 0000-0002-0900-7300
dc.identifier.orcidPihera, Josef 0000-0002-0521-6869
dc.identifier.orcidProsr, Pavel 0000-0002-7484-2492
dc.identifier.orcidŘeboun, Jan 0000-0002-8680-2199
dc.identifier.urihttp://hdl.handle.net/11025/67324
dc.language.isoen
dc.project.IDEH23_021/0008999
dc.publisherIEEE
dc.relation.ispartofseries2025 International Spring Seminar on Electronics Technology, ISSE 2025
dc.subjectceramicsen
dc.subjectdielectric strengthen
dc.subjectthick filmen
dc.subjectaluminaen
dc.subjectaluminum nitrideen
dc.titleStudy of Dielectric Strength of Ceramic Substrates for Power Electronicsen
dc.typeStať ve sborníku (D)
dc.typeSTAŤ VE SBORNÍKU
dc.type.statusPublished Version
local.files.count1*
local.files.size1297931*
local.has.filesyes*
local.identifier.eid2-s2.0-105015762673

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