Temperature dependence of leakage current and noise in Nb2O5 films

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dc.contributor.authorKopecký, Martin
dc.contributor.authorChvátal, Miloš
dc.contributor.authorSedláková, Vlasta
dc.contributor.authorTrčka, Tomáš
dc.contributor.editorPihera, Josef
dc.contributor.editorSteiner, František
dc.date.accessioned2012-11-09T09:53:05Z
dc.date.available2012-11-09T09:53:05Z
dc.date.issued2011
dc.description.abstract-translatedDependence of leakage current on applied voltage was studied for samples of Nb2O5 thin films in the wide temperature range from 10 K to 400 K. Simultaneously low frequency noise characteristics and CV characteristics were measured and evaluated. The studied samples were niobium NbO capacitors with Nb2O5 insulating layer of thickness about 156 nm. IV characteristics measured for different temperature were evaluated and dominant charge carrier transport mechanisms were determined. The ohmic conduction is dominant for the low electric field. It was found that tunneling current is dominant for low temperatures and electric field higher than 125 MV / m while Poole-Frenkel and Shottky mechanisms are more pronounced for electric field below 125 MV / m and temperature above 350 K. The low frequency noise of 1/f type is observed for the tunneling current while G-R noise is observed in case that P-F and Shottky current is dominant.en
dc.format4 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationElectroscope. 2011, č. 4, EDS 2011.cs
dc.identifier.issn1802-4564
dc.identifier.urihttp://147.228.94.30/images/PDF/Rocnik2011/Cislo4_2011/r5c4c1.pdf
dc.identifier.urihttp://hdl.handle.net/11025/622
dc.language.isoenen
dc.publisherZápadočeská univerzita v Plzni, Fakulta elektrotechnickács
dc.relation.ispartofseriesElectroscopecs
dc.rightsCopyright © 2007-2010 Electroscope. All Rights Reserved.en
dc.rights.accessopenAccessen
dc.subjecttenké vrstvycs
dc.subjectNb2O5cs
dc.subjectsvodový proudcs
dc.subjectteplotacs
dc.subject.translatedthin filmsen
dc.subject.translatedleakage currenten
dc.subject.translatedtemperatureen
dc.subject.translatedNb2O5en
dc.titleTemperature dependence of leakage current and noise in Nb2O5 filmsen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

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Číslo 4 - EDS 2011 (2011)
Číslo 4 - EDS 2011 (2011)