Scanning electron microscopy as a useful tool for the analysis of non-conductive materials

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dc.contributor.authorTichá, Iveta
dc.contributor.authorKučerová, Ludmila
dc.contributor.editorKučerová, Ludmila
dc.contributor.editorJirková, Hana
dc.contributor.editorJeníček, Štěpán
dc.date.accessioned2021-12-16T09:50:04Z
dc.date.available2021-12-16T09:50:04Z
dc.date.issued2020
dc.description.abstract-translatedScanning electron microscopy (SEM) in the analysis of non-conductive samples became one of the most important methods for the investigation of material properties. In this work, we used SEM microstructure analysis for the investigation of the origin of cracks in granite composites and also, we tested the porosity inside the regenerated carbon biowaste, potentially used as a clean source of carbon for the future applications in materials production. Additionally, the porosity of small particles used for the moulding processes of plastics was also tested. The importance of the microstructure investigation was supported by Energy-Dispersive X-ray Spectroscopy (EDS) often used for the chemical composition evaluation of these non-conductive materials.en
dc.description.sponsorshipPING Junior 2019 is organized with the support of funds for specific university research project SVK1-2020-005.en
dc.format2 s.cs
dc.format.mimetypeapplication/pdf
dc.identifier.citationKUČEROVÁ, Ludmila ed.; JIRKOVÁ, Hana ed.; JENÍČEK, Štepán ed. Proceedings PING 2020: modern trends in material engineering: 15.-17.09.2020, Pilsen. 1. vyd. Plzeň: University of West Bohemia, 2020, s. 40-41. ISBN 978-80-261-0958-7.cs
dc.identifier.isbn978-80-261-0958-7
dc.identifier.urihttp://hdl.handle.net/11025/46389
dc.language.isoenen
dc.publisherUniversity of West Bohemiaen
dc.rights© University of West Bohemiaen
dc.rights.accessopenAccessen
dc.subjectrastrovací elektronová mikroskopiecs
dc.subjectenergeticky disperzní rentgenová spektroskopiecs
dc.subjectnevodivé materiálycs
dc.subjectfraktografiecs
dc.subjectuhlíková pórovitostcs
dc.subject.translatedscanning electron microscopyen
dc.subject.translatedenergy-dispersive X-ray spectroscopyen
dc.subject.translatednon-conductive materialsen
dc.subject.translatedfractographyen
dc.subject.translatedcarbon porosityen
dc.titleScanning electron microscopy as a useful tool for the analysis of non-conductive materialsen
dc.typekonferenční příspěvekcs
dc.typeconferenceObjecten
dc.type.statusPeer-revieweden
dc.type.versionpublishedVersionen

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Proceedings PING 2020: modern trends in material engineering
Proceedings PING 2020: modern trends in material engineering