Comparison of Measured Data Given by Automatized Measurement Methodology with the Analytical Expression of DLS MOSFET
Date issued
2020
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Západočeská univerzita v Plzni
Abstract
Description
Subject(s)
předem automatizovaný měřicí tok, tranzistory MOS, sonda, síťka, SC transformace, lepicí štítek
Citation
2020 International Conference on Applied Electronics: Pilsen, 8th – 9h September 2020, Czech Republic.