Comprehensive Dielectric Analyses of Polyetheretherketone (PEEK) Thin Film

Abstract

In recent years, the demands on electrical engineering materials have grown, especially regarding reliability and load capacity under increased operational stress, such as elevated temperature or voltage. Polyetheretherketone (PEEK) has emerged as a key material due to its exceptional properties under these conditions. This paper provides a detailed characterization of PEEK thin films, focusing on their electrical insulation properties and high voltage resistance. The study examines the temperature- frequency dependencies of real and imaginary part of complex relative permittivity, identifying relaxation mechanisms (α, α c , β c and σ dc ), and evaluates voltage endurance through time-to- failure tests under HVAC at various voltage levels (48, 56, and 64 kV/mm). Additionally, the interaction with HVDC fields is assessed using space charge analysis at voltage levels up to 50 kV/mm, confirming the presence of homo-charge, that limits the electric field strength in the vicinity of the voltage electrode.